The InGaAs infrared detector, as the core component of photoelectric conversion in the Synchronization Monitoring Atmospheric Corrector (SMAC), is responsible for measuring short-wave infrared spectral and polarization information. Among them, the service life of the thermoelectric cooler (TEC) poses a bottleneck for the overall lifespan of the infrared detector, and its reliability directly affects the normal operation of the detector. A thorough analysis is conducted for the working mechanism of the infrared detector utilized by SMAC and the failure mechanism of the TEC, and the lifetime characteristic of the product is comprehensively evaluated and analyzed through lifespan testing. To minimize time costs, an innovative accelerated lifetime test method is proposed, which utilizes temperature change rate as the accelerated stress. A lifetime test system is developed. Meanwhile, the dark current, relative spectral response, and cooling current of the infrared detector have been measured before and after the lifetime test based on the segmented uniform illumination light source. The experimental results reveal that after a cumulative lifetime test of approximately 120 days, the infrared detector underwent approximately 170,000 temperature cycles. The maximum delta value in the relative spectral responsivity of the infrared detector pre and post the life test is -1.86%, and the maximum increase in the TEC refrigeration drive current is 8.6%. The service life and performance changes of the detector could satisfy the requirements of space payloads. Moreover, the lifetime test system significantly improves test efficiency and exhibits excellent stability and scalability, fully capable of meeting the needs of lifetime tests under different temperature stress levels.
The division of focal plane (DoFP) polarimeters gradually become the mainstream technology in the field of polarization imaging. In this paper, the multispectral DoFP polarimeter is implemented using commercial off-the-shelf technology, and an information model of which is established. Due to the unavoidable nonuniformity of the response of different pixels and the need to ensure data accuracy in quantitative applications, we describe the calibration method to complete the system-level polarimetric calibration of the multispectral DoFP polarimeter. Finally, the validity of the calibration method was verified by testing in the laboratory with high-precision polarizing glass piles with an adjustable polarization degree.
In order to select the devices with high reliability and stability with the potential of aerospace application from the scientific shortwave infrared array detector, the performance test and screening experiment of the shortwave infrared array COMS photoelectric conversion detector equipped with Synchronous Monitoring Atmospheric Corrector were carried out. Firstly, according to the aerospace application requirements, the main performance parameters of shortwave infrared array CMOS devices are simulated and analyzed. Secondly, a set of special image acquisition system of shortwave infrared array CMOS device is designed. Aiming at the performance parameters which can cover the whole spectrum, such as photo response nonuniformity, defect pixels, nonlinearity error and so on, a wide spectrum testing platform based on segmented uniform light source is built. Aiming at the monochromatic performance parameters such as quantum efficiency, a multispectral testing platform based on continuous tunable light source is built. Finally, the performance screening experiments of shortwave infrared array CMOS detectors are carried out by using these test systems, and performance parameters of the tested devices are obtained. The experimental results show that the photo response nonuniformity of the optimized shortwave infrared CMOS detector is 2.79% in 1380 nm band, the number of defect pixels is 4, the maximum non-repeatability of quantum efficiency is 2.18%, and the nonlinearity error is less than 1.16%. The index of the selected device meets the needs of aerospace applications. The research results provide a reference for the screening method and performance evaluation of shortwave infrared array detectors.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.