Dr. Kristof Paredis Profile

Dr. Kristof Paredis

at imec

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Publications (2)

Proceedings Article | 31 May 2022 Presentation + Paper

Deep learning-enabled vertical drift artefact correction for AFM images

Dorin Cerbu, Kristof Paredis, Alain Moussa, Anne-Laure Charley, Philippe Leray

Proceedings Volume PC12053, PC120530L (2022) https://doi.org/10.1117/12.2614029

KEYWORDS: Atomic force microscopy, Neural networks, Metrology, Image processing, Convolution, Line scan image sensors, Scanning probe microscopy, Semiconductors

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Proceedings Article | 22 February 2021 Presentation + Paper

An innovative probe microscopy solution for measuring conductivity profiles in 3-dimensions

U. Celano, K. Paredis, A. D. L. Humphris, M. Tedaldi, C. O'Sullivan, J. P. Hole, J. Goulden

Proceedings Volume 11611, 116110J (2021) https://doi.org/10.1117/12.2583065

KEYWORDS: 3D metrology, Microscopy, Metrology, Switching, Tomography, Semiconductor manufacturing, Gallium arsenide, Diamond, 3D equipment, Transmission electron microscopy

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