Dr. Kaijun Yi Profile

Dr. Kaijun Yi

Research Assistant at Univ of Nebraska Lincoln

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Author

Publications (5)

Proceedings Article | 25 February 2009 Paper

Controlled-growth of single-walled carbon nanotubes using optical near-field effects

W. Xiong, Y. S. Zhou, M. Mahjouri-Samani, W. Q. Yang, K. J. Yi, X. N. He, Y. F. Lu

Proceedings Volume 7202, 720209 (2009) https://doi.org/10.1117/12.808629

KEYWORDS: Single walled carbon nanotubes, Electrodes, Near field optics, Polarization, Near field, Numerical simulations, Optical simulations, Ruthenium, Iron, Scanning electron microscopy

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Proceedings Article | 25 February 2009 Paper

Mapping of individual single-walled carbon nanotubes using nano-Raman spectroscopy

X. N. He, K. J. Yi, Y. F. Lu

Proceedings Volume 7202, 72020E (2009) https://doi.org/10.1117/12.808120

KEYWORDS: Raman spectroscopy, Gold, Micro raman spectroscopy, Scanning tunneling microscopy, Spectroscopy, Silicon, Objectives, Mirrors, Near field scanning optical microscopy, Near field optics

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Proceedings Article | 23 February 2008 Paper

Tip-enhanced near-field Raman spectroscopy using a scanning tunneling microscope with side illumination optics

K. Yi, X. He, Y. Lu

Proceedings Volume 6880, 688006 (2008) https://doi.org/10.1117/12.762183

KEYWORDS: Raman spectroscopy, Silicon, Scanning tunneling microscopy, Remote sensing, Near field optics, Optical alignment, Tungsten, Silver, Polarizers, Near field scanning optical microscopy

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Proceedings Article | 20 March 2007 Paper

Enhancement of Raman scattering using silica microparticles

K. Yi, Y. Lu, H. Wang, Z. Yang

Proceedings Volume 6459, 64590T (2007) https://doi.org/10.1117/12.700693

KEYWORDS: Particles, Raman spectroscopy, Raman scattering, Silicon, Silica, Surface enhanced Raman spectroscopy, Spherical lenses, Near field, Refractive index, Near field optics

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Proceedings Article | 23 February 2006 Paper

Two-dimensional surface characterization of laser-deposited carbon films using Raman scattering

K. Yi, Y. Lu, H. Ling

Proceedings Volume 6107, 61070O (2006) https://doi.org/10.1117/12.644974

KEYWORDS: Raman spectroscopy, Spectroscopy, Objectives, Silicon, Raman scattering, Carbon, Laser scattering, Light scattering, Spatial resolution, Confocal microscopy

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