Dr. Jong Pil Yun
at Korea Institute of Industrial Technology
SPIE Involvement:
Author
Publications (7)

Proceedings Article | 7 June 2023 Poster + Paper
Minwoo Woo, Jong-Pil Yun, Hong-In Won, SeungHyun Jeong, Byeong Hak Kim
Proceedings Volume 12571, 125710M (2023) https://doi.org/10.1117/12.2665505
KEYWORDS: Object detection, RGB color model, Safety, LIDAR, Machine learning, Environmental sensing, Visualization, 3D modeling, Data modeling

SPIE Journal Paper | 14 February 2019
Jong Pil Yun, Sang Jun Lee, Gyogwon Koo, Crino Shin, ChangHyun Park
OE, Vol. 58, Issue 02, 023107, (February 2019) https://doi.org/10.1117/12.10.1117/1.OE.58.2.023107
KEYWORDS: Defect detection, Detection and tracking algorithms, Defect inspection, Binary data, Computer programming, Inspection, Edge detection, Image processing, Cameras, Optimization (mathematics)

SPIE Journal Paper | 22 May 2017
Jong Pil Yun, Dongseob Kim, KyuHwan Kim, Sang Jun Lee, Chang Hyun Park, Sang Woo Kim
OE, Vol. 56, Issue 05, 053108, (May 2017) https://doi.org/10.1117/12.10.1117/1.OE.56.5.053108
KEYWORDS: Defect inspection, Light sources and illumination, Cameras, Image processing, Defect detection, Optical filters, Switching, Visual optics, Detection and tracking algorithms, Computer simulations

Proceedings Article | 13 January 2012 Paper
Doo-chul Choi, Yong-Ju Jeon, Jong Pil Yun, Sang Woo Kim
Proceedings Volume 8350, 83501I (2012) https://doi.org/10.1117/12.920132
KEYWORDS: Detection and tracking algorithms, Algorithm development, Inspection, Image filtering, Defect detection, Cameras, Detector development, Analytical research, Line scan image sensors, Feature extraction

SPIE Journal Paper | 1 March 2009
Jong Yun, SungHoo Choi, Sang Woo Kim
OE, Vol. 48, Issue 03, 037205, (March 2009) https://doi.org/10.1117/12.10.1117/1.3102066
KEYWORDS: Defect detection, Detection and tracking algorithms, Inspection, Wavelet transforms, Image segmentation, Wavelets, Linear filtering, Optical engineering, Manufacturing, Image processing

Showing 5 of 7 publications
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