Thermal changes during diamond turning always present to some degree. For small parts with relatively short cut times, the effects can be minimal with modest thermal management. As parts become large and turning times increase, thermal effects can manifest themselves in a variety of ways. In this paper, we describe three different unique applications where temperature cycling and drift modified the original plan for part fabrication: a roll-to-roll embossed microprism array, a large diameter acrylic lens, and diamond turning a large mandrel.
Optical testing of camera systems in volume production environments can often require expensive tooling and test fixturing. Wide field (fish-eye, hemispheric and hyperhemispheric) optical systems create unique challenges because of the inherent distortion, and difficulty in controlling reflections from front-lit high resolution test targets over the hemisphere. We present a unique design for a test fixture that uses low-cost manufacturing methods and equipment such as 3D printing and an Arduino processor to control back-lit multi-color (VIS/NIR) targets and sources. Special care with LED drive electronics is required to accommodate both global and rolling shutter sensors.
We simulate the predicted Gouy phase anomaly near astigmatic foci of Gaussian beams using a beam
propagation algorithm integrated with lens design software and compare computational results with experimental
data.
Structured mid-spatial frequency surface errors on aspheric optics can create ghost images
and reduced contrast. This reduction in performance is shown to be non-linear with surface height
using Fourier methods without small signal or statistical approximations. Tolerancing MSF errors can
use traditional MTF metrics, and derives peak-to-valley limits on MSF surface height components.
Even the best optical designs can be ruined by unwanted light: flare in the form of ghost images and veiling glare. The
analysis of stray light in an opto-mechanical system is a step in the design process that is often limited to ghost image
analysis by the optical designer. In many large design groups, stray light analysis is traditionally performed by optical
engineers with very specialized analysis tools that are difficult to master. However, recent improvements in software
packages are now offering tools that allow less experienced designers access to tool sets that can perform flare and
veiling glare analysis for a substantial subset of optical design problems. This paper outlines an effective and efficient
design process for determining the types and magnitudes of stray light in an optical system and demonstrates its use on
an injection molded plastic lens assembly. We describe a capability that locates all of the optical paths and their relative
magnitudes through an optical system and separates them into one of three categories: image path, ghost paths, or veiling
glare. We then describe how to leverage this information to determine the most effective removal method for the "worst
offenders".
Most high resolution scanning applications use a rotationally symmetric scan lens and precision motor polygon mirror assemblies or active facet error correction. The realm of passive motion compensation and low-cost motor polygon assemblies tend to be limited to lower-performance systems. The reason for this lies in the symmetry that is broken by tangential beam input to the rotating polygon mirror. An alternative design method is presented, along with examples of application for UV maskless lithography.
Binary Laser Direct-Write (LDW) raster-scan technology for UV exposure of photosensitive materials has been used for single or multiple-pass exposure applications. Gray-scale LDW can be applied to manufacture of 3-D optical structures, but the system requirements are substantially different, since edge slopes and surface departures must be controlled to within fractions of a wavelength.. In this paper, we explore the differences between binary and gray-scale raster imaging applied to micro-optic fabrication, and compare the system model with a prototype high-speed, gray-scale LDW tool that was developed from a Laser Direct Imaging tool originally designed for binary applications.
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