Dr. John M. Lannon
General Manager at Micross Advanced Interconnect Technology
SPIE Involvement:
Author
Publications (20)

Proceedings Article | 3 May 2016 Paper
Tom Danielson, Greg Franks, Nicholas Holmes, Joe LaVeigne, Greg Matis, Steve McHugh, Dennis Norton, Tony Vengel, John Lannon, Scott Goodwin
Proceedings Volume 9820, 98200Z (2016) https://doi.org/10.1117/12.2225856
KEYWORDS: Projection systems, Integrated circuits, Infrared radiation, Detector development, Infrared detectors, Sensors, Packaging, Mid-IR, Integrated circuit design, Temperature metrology

Proceedings Article | 12 May 2015 Paper
Greg Franks, Joe Laveigne, Tom Danielson, Steve McHugh, John Lannon, Scott Goodwin
Proceedings Volume 9452, 94520W (2015) https://doi.org/10.1117/12.2177448
KEYWORDS: Infrared radiation, Projection systems, Packaging, Mid-IR, Integrated circuits, Infrared detectors, Detector development, Electronics, Sensors, Silicon

Proceedings Article | 12 May 2015 Paper
Christopher Fredricksen, Seth Calhoun, Stephen Trewick, Aubrey Coffey, Edward Dein, Kevin Coffey, Robert Peale, Joseph LaVeigne, Gregory Franks, Tom Danielson, John Lannon, Scott Goodwin
Proceedings Volume 9452, 94520X (2015) https://doi.org/10.1117/12.2177025
KEYWORDS: Etching, Resistance, Infrared radiation, Silicon, Dielectrics, Metals, Semiconducting wafers, Dry etching, Resistors, Mid-IR

Proceedings Article | 9 June 2014 Paper
Kevin Sparkman, Joe LaVeigne, Steve McHugh, John Lannon, Scott Goodwin
Proceedings Volume 9071, 90711H (2014) https://doi.org/10.1117/12.2054359
KEYWORDS: Projection systems, Mid-IR, Infrared radiation, Infrared imaging, Integrated circuits, Device simulation, Spatial resolution, Nonuniformity corrections, Dielectrics, Packaging

Proceedings Article | 29 May 2014 Paper
Kevin Sparkman, Joe LaVeigne, Steve McHugh, Jason Kulick, John Lannon, Scott Goodwin
Proceedings Volume 9071, 90711I (2014) https://doi.org/10.1117/12.2054360
KEYWORDS: Packaging, Infrared radiation, Silicon, Projection systems, Semiconducting wafers, Infrared imaging, Integrated circuits, Scanning electron microscopy, Cryogenics, Infrared systems engineering

Showing 5 of 20 publications
Conference Committee Involvement (8)
Technologies for Synthetic Environments: Hardware-in-the-Loop XVIII
2 May 2013 | Baltimore, Maryland, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop XVII
25 April 2012 | Baltimore, Maryland, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop XVI
27 April 2011 | Orlando, Florida, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XV
7 April 2010 | Orlando, Florida, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIV
13 April 2009 | Orlando, Florida, United States
Showing 5 of 8 Conference Committees
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