Ms. Jing Zheng Profile

Jing Zheng

at Chongqing Institute of Metrology and Quality Inspection

SPIE Involvement:

Author

Publications (2)

Proceedings Article | 13 December 2024 Paper

Automatic measurement of particle size based on scanning electron microscopy

Lei Tao, Chong Yue, Jin Zhou, Jing Zheng, Wei Zhang

Proceedings Volume 13500, 135000B (2024) https://doi.org/10.1117/12.3048148

KEYWORDS: Particles, Scanning electron microscopy, Calibration, Edge detection, Microspheres, Image analysis, Electron microscopes, Time metrology, Statistical analysis, Reflection

Read Abstract +

Proceedings Article | 28 May 2024 Poster + Paper

Research on high-precision calibration device for dual-axis tilt sensor

Jin Zhou, XiaoLi Wu, Jing Zheng, Sen Zhou, Xuemei Yang

Proceedings Volume 13083, 1308315 (2024) https://doi.org/10.1117/12.3018671

KEYWORDS: Sensors, Calibration, Sensor calibration, Control systems, Microelectromechanical systems, Metrology, Autocollimators, Accelerometers, Resistance, Optical gratings

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years