Jianlin Li
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 December 2024 Paper
Yongkang Liu, Wei Zhao, Ruixiang Yan, Kai Ni, Yuandong Gu, Jianlin Li
Proceedings Volume 13423, 1342302 (2024) https://doi.org/10.1117/12.3052204
KEYWORDS: Optical proximity correction, Convolution, Lithography, Photoresist materials, Mathematical modeling, Education and training, Deep learning, Source mask optimization, Semiconducting wafers, Optical lithography

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