Mr. Jawad Ahmed Profile

Jawad Ahmed

at SandBox Semiconductor

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Publications (1)

Proceedings Article | 26 May 2022 Poster + Paper

Automated extraction of critical dimension from SEM with Weave

Yang Ban, Bryan Sundahl, Jawad Ahmed, Crystal Barrera, S.V. Sreenivasan, Roger Bonnecaze, Meghali Chopra

Proceedings Volume 12053, 1205327 (2022) https://doi.org/10.1117/12.2614282

KEYWORDS: Scanning electron microscopy, Image segmentation, Artificial intelligence, Image processing, Process engineering, Image analysis, Wet etching, Semiconductors, Neural networks, Metals

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