This paper summarizes the existing technologies in the field of photoelectric countermeasure, discusses the challenges faced by laser angle deception jamming technology, and comprehensively expounds the development direction of photoelectric countermeasure in the field of laser angle deception jamming. In the field of laser jamming technology, the different ways of laser jamming technology and the development of laser jamming weapons are studied. Through the analysis of the principle of laser semi-active guidance and laser angle deception jamming technology, it is found that the traditional laser guidance technology can be intercepted, copied and finally released by our side for decoying because of the simplicity of its laser coding, but facing the new laser guidance technology and the improved laser coding technology, our laser decoying system will face the risk of failure. Therefore, the future laser angle deception jamming must solve the problem of how to avoid the influence of laser coding technology on laser decoy jamming.
Carrier evolution equation (continuity equation) of semi-conductor plays an essential role in simulation of laser interference and electrical damage induced by laser irradiation on charge coupled device (CCD). Solving the Poisson equation, which is coupled with the carrier evolution equation, is a necessary step to obtain the stable electronic field caused by doped atoms and the dynamic one caused by free carriers. In terms of carrier evolution simulation in high resolution-CCD, it is important to solve the Poisson equation promptly and efficiently. For this purpose, we adopt a boundary element method with convolution core combined with Gauss integral algorithm. In this method, we propose the pixel element model in which fast Fourier transform (FFT) is introduced so that the amount of calculation is greatly decreased compared with the finite difference method. In this approach, it is possible to simulate carrier evolution in high-resolution-CCD even on a common personal computer.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.