Dr. Hao Jiang
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 March 2019 Paper
Proceedings Volume 10961, 109610V (2019) https://doi.org/10.1117/12.2515342
KEYWORDS: Lithography, Image quality, Semiconducting wafers, Nanoimprint lithography, Image processing, Artificial intelligence, Process modeling, Performance modeling, Optical components, Reticles

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