Erik M. Krous
Development Engineer at Coherent Inc
SPIE Involvement:
Author
Publications (13)

Proceedings Article | 9 July 2013 Paper
W. Rudolph, L. Emmert, C. Rodriguez, Z. Sun, X. Zhang, Y. Xu, C. Menoni, P. Langston, E. Krous, D. Patel
Proceedings Volume 8786, 878602 (2013) https://doi.org/10.1117/12.2020356
KEYWORDS: Absorption, Dielectrics, Femtosecond phenomena, Laser induced damage, Microscopy, Scattering, Annealing, Particles, Thin films, Reflection

Proceedings Article | 4 December 2012 Paper
C. Menoni, P. Langston, E. Krous, D. Patel, L. Emmert, A. Markosyan, B. Reagan, K. Wernsing, Y. Xu, Z. Sun, R. Route, M. Fejer, J. Rocca, W. Rudolph
Proceedings Volume 8530, 85300J (2012) https://doi.org/10.1117/12.981732
KEYWORDS: Oxygen, Absorption, Laser induced damage, Picosecond phenomena, Metals, Oxides, Thin films, Sputter deposition, Ion beams, Silica

Proceedings Article | 6 December 2010 Paper
Carmen Menoni, Erik Krous, Dinesh Patel, Peter Langston, Jonathan Tollerud, Duy Nguyen, Luke Emmert, Ashot Markosyan, Roger Route, Martin Fejer, Wolfgang Rudolph
Proceedings Volume 7842, 784202 (2010) https://doi.org/10.1117/12.855604
KEYWORDS: Laser induced damage, Ion beams, Sputter deposition, Oxygen, Scandium, Picosecond phenomena, Refractive index, Atomic force microscopy, Argon, Optical coatings

Proceedings Article | 29 November 2010 Paper
Proceedings Volume 7842, 784211 (2010) https://doi.org/10.1117/12.868035
KEYWORDS: Ionization, Dielectrics, Laser damage threshold, Pulsed laser operation, Picosecond phenomena, Femtosecond phenomena, Absorption, Dielectric breakdown, Laser induced damage, Oxides

Proceedings Article | 31 December 2009 Paper
Proceedings Volume 7504, 750402 (2009) https://doi.org/10.1117/12.836504
KEYWORDS: Nitrogen, Laser damage threshold, Oxides, Hafnium, Doping, Electrons, Dielectric breakdown, Oxygen, Ions, Ionization

Showing 5 of 13 publications
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