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Edoardo Stanzani
at FLUXiM AG
SPIE Involvement:
Author
Publications (1)
Proceedings Article | 1 October 2023 Presentation + Paper
Evidence for generation of trap states during degradation of TADF OLEDs
Stefano Sem, Antonio Cabas Vidani, Edoardo Stanzani, Sandra Jenatsch, Simon Zuefle, Beat Ruhstaller
Proceedings Volume 12659, 1265902 (2023) https://doi.org/10.1117/12.2677265
KEYWORDS: Organic light emitting diodes, Simulations, Electro optical modeling, Electrons, Electro optics, Temperature metrology, Televisions, Tablets, Silver, Luminous efficiency
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