Douglas Patriarche
Co-founder at AI Analysis Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 26 May 2022 Presentation + Paper
Proceedings Volume 12053, 120530A (2022) https://doi.org/10.1117/12.2615753
KEYWORDS: Scanning electron microscopy, Monte Carlo methods, Visualization, Metrology, Photoresist materials, Chemical mechanical planarization, Silicon, Optical simulations, Signal to noise ratio

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