Dr. David W. Kisker Profile

Dr. David W. Kisker

at eOptra LLC

SPIE Involvement:

Author

Publications (9)

Proceedings Article | 23 February 2011 Paper

Automated optical cell detection, sorting, and temperature measurements

Joel Kindt, Mujahid Naqbi, Torsten Kiljan, Wesley Fuller, Weina Wang, David Kisker, Kevin Lear

Proceedings Volume 7902, 790222 (2011) https://doi.org/10.1117/12.875608

KEYWORDS: Microfluidics, Electrodes, Dielectrophoresis, Temperature metrology, Spectroscopy, Fabry–Perot interferometers, Optical analysis, Refraction, Glasses, Refractive index

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Proceedings Article | 24 February 2010 Paper

Transverse mode analysis of optofluidic intracavity spectroscopy of canine hemangiosarcoma

Weina Wang, Douglas Thamm, David Kisker, Kevin Lear

Proceedings Volume 7559, 75590C (2010) https://doi.org/10.1117/12.842142

KEYWORDS: Cancer, Microfluidics, Spectroscopy, Blood, Diagnostics, Tumor growth modeling, Statistical analysis, Mirrors, Diffraction, Resonators

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Proceedings Article | 16 June 2004 Paper

1.3-µm VCSEL production issues

David Kisker, Leo Chirovsky, Ryan Naone, James Van Hove, Jennifer Rossler, Martin Adamcyk, N. Wasinger, James Beltran, David Galt

Proceedings Volume 5364, (2004) https://doi.org/10.1117/12.539285

KEYWORDS: Vertical cavity surface emitting lasers, Semiconducting wafers, Temperature metrology, Process control, Reliability, Eye, Statistical analysis, Resistance, Control systems, Manufacturing

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Proceedings Article | 4 June 2002 Paper

Characterization of VCSEL modal output using near-field scanning optical microscopy

William Bradford, Joseph Beach, Reuben Collins, David Galt, David Kisker

Proceedings Volume 4649, (2002) https://doi.org/10.1117/12.469220

KEYWORDS: Vertical cavity surface emitting lasers, Near field scanning optical microscopy, Near field optics, Refraction, Spectroscopy, Laser scattering, Spatial resolution, Signal detection, Scanning probe microscopy, Spectroscopes

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Proceedings Article | 4 June 2002 Paper

Performance of monolithic 1.3m VCSELs in telecom applications

Larry Thompson, Leo Chirovsky, Andrew Jackson, Ryan Naone, David Galt, Simon Prakash, Stewart Feld, Max Crom, John Wasserbauer, Michael Lange, B. Mayer, David Kisker

Proceedings Volume 4649, (2002) https://doi.org/10.1117/12.469246

KEYWORDS: Vertical cavity surface emitting lasers, Networks, Gallium arsenide, Telecommunications, Eye, Temperature metrology, Reliability, Manufacturing, Local area networks, Modulation

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Proceedings Article | 8 November 2001 Paper

1.3-um InGaAsN VCSELs for telecom and datacom applications

Andrew Jackson, Ryan Naone, Leo Chirovsky, Stewart Feld, David Galt, Mark Dalberth, Joseph Smith, Lance Thompson, Michael Lange, David Kisker

Proceedings Volume 4533, (2001) https://doi.org/10.1117/12.447770

KEYWORDS: Vertical cavity surface emitting lasers, Quantum wells, Gallium arsenide, Nitrogen, Modulation, Semiconducting wafers, Oxides, Data communications, Eye

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Proceedings Article | 4 May 2001 Paper

High-speed VCSELs for next-generation telecommunications links

John Wasserbauer, James Beltran, J. Bisberg, Leo Chirovsky, David Galt, T. Hudson, Andrew Jackson, David Kisker, Michael Lange, Ryan Naone, Simon Prakash, Larry Thompson

Proceedings Volume 4286, (2001) https://doi.org/10.1117/12.424793

KEYWORDS: Oxides, Mirrors, Reliability, Diffusion, Eye, Vertical cavity surface emitting lasers, Resistance, Modulation, Transponders, Chemical elements

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Proceedings Article | 2 September 1992 Paper

In-situ x-ray studies of OMVPE growth

Paul Fuoss, Frank Lamelas, P. Imperatori, David Kisker, G. Brian Stephenson, Sean Brennan

Proceedings Volume 1676, (1992) https://doi.org/10.1117/12.137660

KEYWORDS: X-rays, Scattering, Gallium arsenide, Absorption, Laser scattering, X-ray fluorescence spectroscopy, Luminescence, Chemical reactions, Arsenic, Synchrotron radiation

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Proceedings Article | 1 October 1990 Paper

Application of x-ray scattering to the in-situ study of organometallic vapor phase epitaxy

David Kisker, Paul Fuoss, Goullioud Renaud, K. Tokuda, Sean Brennan, J. Kahn

Proceedings Volume 1285, (1990) https://doi.org/10.1117/12.20803

KEYWORDS: Gallium arsenide, X-rays, Scattering, Oxides, Hydrogen, Vapor phase epitaxy, Semiconductors, Data modeling, Natural surfaces, Epitaxy

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Showing 5 of 9 publications

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