We present test results from a compact, fast (F/1.4) imaging spectrometer system with a 33° field of view, operating in
the 450-1650 nm wavelength region with an extended response InGaAs detector array. The system incorporates a simple
two-mirror telescope and a steeply concave bilinear groove diffraction grating made with gray scale x-ray lithography
techniques. High degree of spectral and spatial uniformity (97%) is achieved.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.