Prof. Daewook Kim
Associate Professor
SPIE Involvement:
Engineering, Science, and Technology Policy Committee | Board of Directors | Nominating and Leadership Development Committee | Conference Program Committee | Conference Chair | Editor | Author | Instructor
Area of Expertise:
large precision optics fabrication using Computer Controlled Optical Surfacing (CCOS) process , open-source data analysis and visualization S/W platform development , optical testing for large optical components using computer generated holograms, laser tracker, interferometer , optical system design and manufacturing
Websites:
Publications (168)

Proceedings Article | 1 October 2024 Presentation + Paper
Yiyang Huang, Roger Angel, Hyukmo Kang, Heejoo Choi, Matt Rademacher, Hill Tailor, Rebecca Su, Daewook Kim
Proceedings Volume 13132, 131320E (2024) https://doi.org/10.1117/12.3026858
KEYWORDS: Metrology, Deflectometry, Deformation, Reflectors, Displays, Reflection, Actuators, Data processing, Zemax, Phase unwrapping

Proceedings Article | 1 October 2024 Poster + Paper
Sonam Berwal, Neha Khatri, Daewook Kim
Proceedings Volume 13132, 131320I (2024) https://doi.org/10.1117/12.3027243
KEYWORDS: Mirrors, Parabolic mirrors, Solar energy, Solar radiation, Sunlight, Design, Sun, Reflection, Solar concentrators, Laser resonators

Proceedings Article | 1 October 2024 Presentation + Paper
R. Angel, N. Didato, R. Eads, D. Kim
Proceedings Volume 13132, 131320G (2024) https://doi.org/10.1117/12.3028382
KEYWORDS: Reflectors, Cameras, Sun, Solids, Reflection, Design, Sunlight, Receivers, Solar energy, Medium wave

Proceedings Article | 1 October 2024 Presentation
Myoung Choul Choi, Aram Hong, Sangwon Hyun, Mourad Idir, Tianyi Wang, Dae Wook Kim
Proceedings Volume PC13134, PC1313406 (2024) https://doi.org/10.1117/12.3027095
KEYWORDS: Surface finishing, Ion beams, Statistical analysis, Ion beam finishing, Etching, Beam diameter

Proceedings Article | 1 October 2024 Poster
Aram Hong, Myoung Choul Choi, Sangwon Hyun, Tianyi Wang, Mourad Idir, Daewook Kim
Proceedings Volume PC13134, PC131340B (2024) https://doi.org/10.1117/12.3027378
KEYWORDS: Ion beams, Precision optics, Optical surfaces, Sputter deposition, Profiling, Polishing, Physical coherence, Mass spectrometry, Ions, Ion beam finishing

Showing 5 of 168 publications
Proceedings Volume Editor (13)

Showing 5 of 13 publications
Conference Committee Involvement (33)
Astronomical Applications
3 August 2025 | San Diego, United States
Advances in Solar Energy: Heliostat Systems Design, Implementation, and Operation II
3 August 2025 | San Diego, California, United States
Astronomical Optics: Design, Manufacture, and Test of Space and Ground Systems V
3 August 2025 | San Diego, California, United States
Optical Design Automation
3 August 2025 | San Diego, California, United States
Interferometry and Structured Light 2024
21 August 2024 | San Diego, California, United States
Showing 5 of 33 Conference Committees
Course Instructor
SC212: Modern Optical Testing
This course describes the basic interferometry techniques used in the evaluation of optical components and optical systems. It discusses interferogram interpretation, computer analysis, and phase-shifting interferometry, as well as various commonly used wavefront-measuring interferometers. The instructor describes specialized techniques such as testing windows and prisms in transmission, 90-degree prisms and corner cubes, measuring index inhomogeneity, and radius of curvature. Testing cylindrical and aspheric surfaces, determining the absolute shape of flats and spheres, and the use of infrared interferometers for testing ground surfaces are also discussed. The course also covers state-of-the-art direct phase measurement interferometers.
SC213: Introduction to Interferometric Optical Testing
This short course introduces the field of interferometric optical testing. Topics covered include basic interferometers for optical testing, and concepts of phase-shifting interferometry including error analysis. Long wavelength interferometry, testing of aspheric surfaces, measurement of surface microstructure, and the state-of-the-art of direct phase measurement interferometers are also discussed.
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