Mr. Chun-Hung Lin Profile

Chun-Hung Lin

at Winbond Electronics Corp

SPIE Involvement:

Author

Publications (1)

Proceedings Article | 20 March 2020 Paper

Tung-Yu Wu, Chun Yen Liao, Chun-Hung Lin, Kao-Tsai Tsai, Jun-Sheng Wu, Chao-Yi Huang

Proceedings Volume 11325, 113252G (2020) https://doi.org/10.1117/12.2551686

KEYWORDS: Image processing, Image analysis, Critical dimension metrology, Convolution, Neural networks, Data modeling, Semiconducting wafers

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