14 December 2015 Si-based infrared optical filters
Armandas Balčytis, Meguya Ryu, Gediminas Seniutinas, Yoshiaki Nishijima, Yuta Hikima, Massimiliano Zamengo, Raimondas Petruškevičius, Junko Morikawa, Saulius Juodkazis
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Abstract
Pyramidal silicon nanospikes, termed black-Si (b-Si), with controlled height of 0.2 to 1  μm, were fabricated by plasma etching over 3-in wafers and were shown to act as variable density filters in a wide range of the IR spectrum 2.5 to 20  μm, with transmission and its spectral gradient dependent on the height of the spikes. Such variable density IR filters can be utilized for imaging and monitoring applications. Narrow IR notch filters were realized with gold mesh arrays on Si wafers prospective for applications in surface-enhanced IR absorption sensing and “cold materials” for heat radiation into atmospheric IR transmission window. Both types of filters for IR: spectrally variable and notch are made by simple fabrication methods.
© 2015 Society of Photo-Optical Instrumentation Engineers (SPIE) 0091-3286/2015/$25.00 © 2015 SPIE
Armandas Balčytis, Meguya Ryu, Gediminas Seniutinas, Yoshiaki Nishijima, Yuta Hikima, Massimiliano Zamengo, Raimondas Petruškevičius, Junko Morikawa, and Saulius Juodkazis "Si-based infrared optical filters," Optical Engineering 54(12), 127103 (14 December 2015). https://doi.org/10.1117/1.OE.54.12.127103
Published: 14 December 2015
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CITATIONS
Cited by 9 scholarly publications.
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KEYWORDS
Infrared imaging

Optical filters

Silicon

Reflectivity

Thermography

Infrared radiation

Linear filtering

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