Short wavelength and polarized phase shifting fringe projection imaging of translucent objects

Rongguang Liang

doi:10.1117/1.OE.53.1.014104

21 January 2014 Short wavelength and polarized phase shifting fringe projection imaging of translucent objects

Rongguang Liang

Author Affiliations +

Optical Engineering, Vol. 53, Issue 1, 014104 (January 2014). https://doi.org/10.1117/1.OE.53.1.014104

Abstract

Measuring surface topography of translucent objects with phase shifting fringe projection method is a challenge because of the reduced fringe contrast due to the scattering inside the object. The internal structure also has an impact to the measurement. We present a new phase shifting fringe project imaging method to measure three-dimensional surface shapes of translucent objects. This method employs polarized short wavelength to increase the fringe contrast by reducing the internal scattered light from reaching the camera.

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Rongguang Liang "Short wavelength and polarized phase shifting fringe projection imaging of translucent objects," Optical Engineering 53(1), 014104 (21 January 2014). https://doi.org/10.1117/1.OE.53.1.014104

Published: 21 January 2014

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