Electric field-induced optical path change profiling using a Pohl interferometer

Xi Yang; Lowell L. Wood; John H. Miller Jr.

doi:10.1117/1.1512662

1 November 2002 Electric field-induced optical path change profiling using a Pohl interferometer

Xi Yang, Lowell L. Wood, John H. Miller Jr.

Optical Engineering, Vol. 41, Issue 11, (November 2002). https://doi.org/10.1117/1.1512662

We describe an optical technique using the principles of a Pohl interferometer and divergent laser beams for measuring optical path changes in the spaces between interdigital electrodes. We present experimental results of the electric-field-induced optical path changes in an electrode space using a LiNbO₃ sample.

©(2002) Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation Download Citation

Xi Yang, Lowell L. Wood, and John H. Miller Jr. "Electric field-induced optical path change profiling using a Pohl interferometer," Optical Engineering 41(11), (1 November 2002). https://doi.org/10.1117/1.1512662

Published: 1 November 2002

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