Influence of a general small inclination on the measurement in Talbot interferometry

Qian Liu; Ryoji Ohba

doi:10.1117/1.1361105

1 May 2001 Influence of a general small inclination on the measurement in Talbot interferometry

Qian Liu, Ryoji Ohba

Optical Engineering, Vol. 40, Issue 5, (May 2001). https://doi.org/10.1117/1.1361105

The effects of a general small inclination between the two grating planes on the moire fringes in Talbot interferometry under illumination with a plane wave are studied. The inclination is generated by rotating the beamsplitter grating through two small angles around the two perpendicular axes in the grating plane, making an arbitrary angle with the line direction of the grating. Some simple judgement and adjustment methods for the inclination are presented. The results obtained by theoretical analysis have been verified by experiments.

©(2001) Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation Download Citation

Qian Liu and Ryoji Ohba "Influence of a general small inclination on the measurement in Talbot interferometry," Optical Engineering 40(5), (1 May 2001). https://doi.org/10.1117/1.1361105

Published: 1 May 2001

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