Abstract

This is a list of reviewers who served the Journal of Micro/Nanolithography, MEMS, and MOEMS in 2020.

The Journal of Micro/Nanolithography, MEMs, and MOEMS would like to sincerely thank the following individuals who served as reviewers in 2020. The success of our publication hinges on the voluntary contributions of time and energy put forth by these professionals.

  • Kostas Adam

  • Frank Altmann

  • Deepak Bansal

  • Bryan Barnes

  • John Biafore

  • Gregory Blachut

  • Harald Bosse

  • Timothy Brunner

  • Steven Carson

  • Lingqian Chang

  • Siddharth Chauhan

  • Tsunglin Chen

  • Santhosh Chidangil

  • Vassilios Constantoudis

  • Maxime Darnon

  • Peter De Bisschop

  • Ilan Englard

  • Andreas Erdmann

  • Germain Fenger

  • Tim Fuehner

  • Allen Gabor

  • Rohit Goswami

  • Yan Gu

  • Eric Hendrickx

  • Mark-Alexander Henn

  • Craig Higgins

  • Stephen Hsu

  • Su-Mi Hur

  • Ningning Jia

  • Sumit Jindal

  • Young Bok(Abraham) Kang

  • Byungki Kim

  • Yoontae Kim

  • Ashish Kumar

  • Varun Kumar

  • Sujatha Lakshmi Narayanan

  • Azat Latypov

  • Fengyuan Li

  • Peng Li

  • Qinghuang Lin

  • Bernard Liu

  • Chichun Liu

  • Rajesh Luharuka

  • Chris Mack

  • Hazem Mesilhy

  • Fateme Mohammadi

  • Vemuru Moorthy

  • Banibrata Mukherjee

  • Viviana Mulloni

  • Andrew Neureuther

  • Bernardo Oyarzun Rivera

  • Antoine Pacco

  • Piyush Pathak

  • Eakkachai Pengwang

  • Michele Perego

  • John Petersen

  • Vicky Philipsen

  • Gayathri Pillai

  • Thomas Pistor

  • Christopher Progler

  • Ivo Rangelow

  • Gijsbert Rispens

  • Paul Rissman

  • Chandra Sarma

  • Frank Scholze

  • Kazunori Seki

  • Nader Shamma

  • Mark Smith

  • Seiichi Tagawa

  • Kiyoshi Takamasu

  • Abhishek Vikram

  • John Villarrubia

  • Shrenik Vora

  • Fei Wang

  • Hao Wang

  • Ulrich Welling

  • Rudy Wojtecki

  • Jiwen Xiang

  • Michael Yeung

  • Kenji Yoshimoto

  • Bei Yu

© 2021 Society of Photo-Optical Instrumentation Engineers (SPIE)
"2020 List of Reviewers," Journal of Micro/Nanopatterning, Materials, and Metrology 20(1), 010103 (15 January 2021). https://doi.org/10.1117/1.JMM.20.1.010103
Published: 15 January 2021
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KEYWORDS
Lithium

Microelectromechanical systems

Microopto electromechanical systems

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