Pulse characterization using a temporal knife-edge in ENZ films

Adam Ball; Jingwei Wu; Samprity Saha; Dhruv Fomra; Nathaniel Kinsey

doi:10.1117/12.3027517

3 October 2024 Pulse characterization using a temporal knife-edge in ENZ films

Adam Ball, Jingwei Wu, Samprity Saha, Dhruv Fomra, Nathaniel Kinsey

Proceedings Volume PC13110, Active Photonic Platforms (APP) 2024; PC131100C (2024) https://doi.org/10.1117/12.3027517
Event: Nanoscience + Engineering, 2024, San Diego, California, United States

Abstract

We demonstrate a use case for the ENZ region of transparent conducting oxides as a means for compact and phase-matching free pulse characterization for near-infrared beams. We leverage a ‘temporal knife edge’, generated by an off-axis pump to extract the spatial shape and pulse width information of a Gaussian beam using a quadrant cell detector. Operating within the ENZ region enables the use of sub-micron thick films and moderate optical fluences (1-10 GW/cm2) compared to conventional bulk dielectrics or crystals, for compact pulse characterization systems.

Conference Presentation

Citation Download Citation

Adam Ball, Jingwei Wu, Samprity Saha, Dhruv Fomra, and Nathaniel Kinsey "Pulse characterization using a temporal knife-edge in ENZ films", Proc. SPIE PC13110, Active Photonic Platforms (APP) 2024, PC131100C (3 October 2024); https://doi.org/10.1117/12.3027517

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