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18 June 2024 Finite element numerical investigation of light scattering impact in multilayered stacks
Yousra Toumi, Fabien Lemarchand, Cyril Favard, Julien Lumeau, Guillaume Demésy, Aude L. Lereu
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Proceedings Volume PC13020, Advances in Optical Thin Films VIII; PC130200U (2024) https://doi.org/10.1117/12.3022305
Event: SPIE Optical Systems Design, 2024, Strasbourg, France
Abstract
Dielectric multilayers can be designed and fabricated to reach large optical field enhancement when working under total internal reflection. In an objective based total internal reflection fluorescence microscopy (TIRF-M), we propose to use the resulting large field enhancement supported in such resonant coverslip to improve TIRF-M sensitivity by amplifying the collected fluorescence signal. Scattering effects due to roughness of the substrate may parasite the optical response of our designed multilayer-based component. We present here the numerical model of the roughness impact over the multilayer optical response.
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Yousra Toumi, Fabien Lemarchand, Cyril Favard, Julien Lumeau, Guillaume Demésy, and Aude L. Lereu "Finite element numerical investigation of light scattering impact in multilayered stacks", Proc. SPIE PC13020, Advances in Optical Thin Films VIII, PC130200U (18 June 2024); https://doi.org/10.1117/12.3022305
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KEYWORDS
Multilayers
Light scattering
Diffraction
Resonance enhancement
Scattering
Total internal reflection
Reflection
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