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This conference presentation, “A method based on complementary transmission and reflection measurements for extracting the optical properties of a thin film” was presented at the Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XV conference at SPIE Photonics West 2022.
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Brett N. Carnio, Anis Attiaoui, Simone Assali, Oussama Moutanabbir, Abdul Elezzabi, "A method based on complementary transmission and reflection measurements for extracting the optical properties of a thin film," Proc. SPIE PC12000, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XV, PC120000E (7 March 2022); https://doi.org/10.1117/12.2607676