Analysis of 980nm emitting single-spatial mode diode lasers at high power levels by complementary imaging techniques

Martin Hempel; Jens W. Tomm; Thomas Elsaesser; David Venables; Victor Rossin; Erik Zucker

doi:10.1117/12.2075896

13 March 2015 Analysis of 980nm emitting single-spatial mode diode lasers at high power levels by complementary imaging techniques

Martin Hempel, Jens W. Tomm, Thomas Elsaesser, David Venables, Victor Rossin, Erik Zucker

Author Affiliations +

Proceedings Volume 9348, High-Power Diode Laser Technology and Applications XIII; 93480N (2015) https://doi.org/10.1117/12.2075896
Event: SPIE LASE, 2015, San Francisco, California, United States

Abstract

Pulsed operation of standard 980-nm emitting single-spatial-mode high power diode lasers at multi-watt power levels is studied. Primary emission, short wavelength infrared emission, as well as the spatio-temporal evolution of the near field are recorded. This approach allows for the determination of the operation parameters during which single-mode operation is maintained. This gives limits of safe operation far beyond the standard specifications as well as information about the relevant degradation mechanisms in this regime. Reference experiments with a set of long-term operated devices reveal gradual aging signatures and the starting points of the relevant aging processes become detectable. They are compared with those obtained from the devices operated under pulsed conditions.

Citation Download Citation

Martin Hempel, Jens W. Tomm, Thomas Elsaesser, David Venables, Victor Rossin, and Erik Zucker "Analysis of 980nm emitting single-spatial mode diode lasers at high power levels by complementary imaging techniques", Proc. SPIE 9348, High-Power Diode Laser Technology and Applications XIII, 93480N (13 March 2015); https://doi.org/10.1117/12.2075896

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