Uncertainties evaluations in the ray-tracing algorithm based on Monte Carlo method

Guojin Feng; Ping Li; Yingwei He; Yu Wang; Houping Wu

doi:10.1117/12.2068015

21 August 2014 Uncertainties evaluations in the ray-tracing algorithm based on Monte Carlo method

Guojin Feng, Ping Li, Yingwei He, Yu Wang, Houping Wu

Author Affiliations +

Proceedings Volume 9283, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems; 92830Y (2014) https://doi.org/10.1117/12.2068015
Event: 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2014), 2014, Harbin, China

Abstract

Although Ray tracing method is an effective aided design method in optical system, the uncertainty caused by this method is not very clearly. The relationship between the number of rays and uncertainty has been explored in this paper, while using the Monte Carlo algorithm in Ray tracing method. It shows that if the simulation relative deviation should be limited to 0.1%, at least 1000000 rays must be used.

Citation Download Citation

Guojin Feng, Ping Li, Yingwei He, Yu Wang, and Houping Wu "Uncertainties evaluations in the ray-tracing algorithm based on Monte Carlo method", Proc. SPIE 9283, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems, 92830Y (21 August 2014); https://doi.org/10.1117/12.2068015

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

;

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
4 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Monte Carlo methods

Computer simulations

Ray tracing

Optical design

Sensors

Metrology

Error analysis

Show All Keywords

Keywords/Phrases

Search In:

Publication Years