Paper
11 September 2013 The lifetime prediction model of stirling cryocooler for infrared detector assembly
Author Affiliations +
Proceedings Volume 8907, International Symposium on Photoelectronic Detection and Imaging 2013: Infrared Imaging and Applications; 89075L (2013) https://doi.org/10.1117/12.2035196
Event: ISPDI 2013 - Fifth International Symposium on Photoelectronic Detection and Imaging, 2013, Beijing, China
Abstract
With the rapid development of infrared focal plane array detector, stirling cyrocooler as a cold source has played an important role in space application. However, it is difficult to qualify its reliability and life expectancy before space application. Existing experiment and research data show that the most critical factor to restrict stirling cryocooler’s service life is working gas contamination. Based on outgassing of stirling cryocooler internal material and its relationship with temperature, time and outgassing experimental data, the failure life model of contamination is proposed. By thousands of hours of accelerated life test, two types of prototype cryocooler have been verified for applicability of the proposed life model, and the working gas analysis of tested cryocoolers also proved the existence of contamination. Afterwards, through three group contaminations adding experiment of different level water vapor, the degradation characteristics of more than 1000 hour have proved complying with the life model above. Finally, the paper further verified the applicability of this model by the fitting of experimental data of long-term running in working condition. Consequently, the life model of stirling cryocooler caused contamination degradation is established, as well as an accelerated lifetime evaluation technique was proposed for stirling cryocooler.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shao-hua Yang, Xin-guang Liu, and Yi-nong Wu "The lifetime prediction model of stirling cryocooler for infrared detector assembly", Proc. SPIE 8907, International Symposium on Photoelectronic Detection and Imaging 2013: Infrared Imaging and Applications, 89075L (11 September 2013); https://doi.org/10.1117/12.2035196
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KEYWORDS
Contamination

Cryocoolers

Data modeling

Prototyping

Accelerated life testing

Failure analysis

Reliability

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