Laser induced damage of dielectrics down to few cycle pulse duration: test bench and measurements

O. Utéza; R. Clady; N. Sanner; M. Sentis

doi:10.1117/12.2016754

7 May 2013 Laser induced damage of dielectrics down to few cycle pulse duration: test bench and measurements

O. Utéza, R. Clady, N. Sanner, M. Sentis

Proceedings Volume 8780, High-Power, High-Energy, and High-Intensity Laser Technology; and Research Using Extreme Light: Entering New Frontiers with Petawatt-Class Lasers; 87800H (2013) https://doi.org/10.1117/12.2016754
Event: SPIE Optics + Optoelectronics, 2013, Prague, Czech Republic

Abstract

Results of laser induced damage threshold (LIDT) of fused silica, sapphire and Ti:Sa crystals in single shot mode in the femtosecond regime down to few optical cycles (< 10 fs) are presented. Different approaches to determine LIDT are described and compared. Our methodology yields accurate determination of damage/ablation threshold of any material (or component) irradiated by pulsed laser, as well as complementary physical results characterizing laser–matter interaction and/or concerning the deterministic character of femtosecond damage. It is shown that the abrupt decrease of both damage and ablation thresholds observed with ultra-short pulses (< 30 fs) is related to the significance of tunnel ionization in the ultrashort regime. Moreover, the results indicate that the laser damage occurrence is more deterministic below 30 fs.

Citation Download Citation

O. Utéza, R. Clady, N. Sanner, and M. Sentis "Laser induced damage of dielectrics down to few cycle pulse duration: test bench and measurements", Proc. SPIE 8780, High-Power, High-Energy, and High-Intensity Laser Technology; and Research Using Extreme Light: Entering New Frontiers with Petawatt-Class Lasers, 87800H (7 May 2013); https://doi.org/10.1117/12.2016754

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