Reliability and degradation of oxide VCSELs due to reaction to atmospheric water vapor

Alexandru Dafinca; Anthony R. Weidberg; Steven J. McMahon; Alexander A. Grillo; Philippe Farthouat; Michael Ziolkowski; Robert W. Herrick

doi:10.1117/12.2001195

13 March 2013 Reliability and degradation of oxide VCSELs due to reaction to atmospheric water vapor

Alexandru Dafinca, Anthony R. Weidberg, Steven J. McMahon, Alexander A. Grillo, Philippe Farthouat, Michael Ziolkowski, Robert W. Herrick

Author Affiliations +

Proceedings Volume 8639, Vertical-Cavity Surface-Emitting Lasers XVII; 86390L (2013) https://doi.org/10.1117/12.2001195
Event: SPIE OPTO, 2013, San Francisco, California, United States

Abstract

850nm oxide-aperture VCSELs are susceptible to premature failure if operated while exposed to atmospheric water vapor, and not protected by hermetic packaging. The ATLAS detector in CERN’s Large Hadron Collider (LHC) has had approximately 6000 channels of Parallel Optic VCSELs fielded under well-documented ambient conditions. Exact time-to-failure data has been collected on this large sample, providing for the first time actual failure data at use conditions. In addition, the same VCSELs were tested under a variety of accelerated conditions to allow us to construct a more accurate acceleration model. Failure analysis information will also be presented to show what we believe causes corrosion-related failure for such VCSELs.

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Alexandru Dafinca, Anthony R. Weidberg, Steven J. McMahon, Alexander A. Grillo, Philippe Farthouat, Michael Ziolkowski, and Robert W. Herrick "Reliability and degradation of oxide VCSELs due to reaction to atmospheric water vapor", Proc. SPIE 8639, Vertical-Cavity Surface-Emitting Lasers XVII, 86390L (13 March 2013); https://doi.org/10.1117/12.2001195

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