Planar integrated photonics spectrograph on silicon-nitride-on-insulator: densely integrated systems for astrophotonics and spectroscopy

Harendra N. J. Fernando; Andreas Stoll; René Eisermann; Jose C. Boggio; Lars Zimmermann; Roger Haynes; Martin M. Roth

doi:10.1117/12.925561

13 September 2012 Planar integrated photonics spectrograph on silicon-nitride-on-insulator: densely integrated systems for astrophotonics and spectroscopy

Harendra N. J. Fernando, Andreas Stoll, René Eisermann, Jose C. Boggio, Lars Zimmermann, Roger Haynes, Martin M. Roth

Author Affiliations +

Proceedings Volume 8450, Modern Technologies in Space- and Ground-based Telescopes and Instrumentation II; 845046 (2012) https://doi.org/10.1117/12.925561
Event: SPIE Astronomical Telescopes + Instrumentation, 2012, Amsterdam, Netherlands

Abstract

A conventional Arrayed Waveguide Grating (AWG) has been modified, without output receiver waveguides, for nonconventional applications such as Astrophotonics and spectroscopy sensing where the input signal can have information over the entire band and a continuum of light/spectrum. The material system chosen for the AWG design is siliconnitride/ SiO₂/Si (Si₃N₄-SiO₂-Si) for its relatively high refractive index, which for a given channel spacing allowing a more compact device than Silicon-on-Silica. Further, CMOS compatibility and the presence of high non-liner optical coefficient would be an added advantage to design and fabricate densely integrated photonic sub-systems, such as calibration source and AWG, for astrophotonics and spectroscopy. The proposed AWG utilizes a flat image plane optimized for minimal aberration. An analytical calculation, based on Gaussian beam approximation, was used to determine the optimal flat plane position where the non-uniformity in 1/e electric field widths is minimal. This plane can be used as the dicing plane to re-image the entire output of the AWG onto a detector array to sample the entire spectrum. Tailored AWG, with flat image-plane, designed to resolve 48 spectral channels with 0.4nm (50GHz) resolution and adjacent channel cross-talk level within a 0.2nm window (ITU-grid) ~ -28dB. Calculated insertion loss non-uniformity is close to 3dB. The foot-print of high index contrast (Δn=23%) IPS is ~ 12x8.5 mm². The modelled mean spectral resolving power, R, at the flat image-plane is ~ 7,600. The design principle could be utilised for devices using other material systems with different parameters.

Citation Download Citation

Harendra N. J. Fernando, Andreas Stoll, René Eisermann, Jose C. Boggio, Lars Zimmermann, Roger Haynes, and Martin M. Roth "Planar integrated photonics spectrograph on silicon-nitride-on-insulator: densely integrated systems for astrophotonics and spectroscopy", Proc. SPIE 8450, Modern Technologies in Space- and Ground-based Telescopes and Instrumentation II, 845046 (13 September 2012); https://doi.org/10.1117/12.925561

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

;

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
11 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Waveguides

Silicon

Receivers

Computer aided design

Integrated photonics

Spectral resolution

Spectrographs

Show All Keywords

Keywords/Phrases

Search In:

Publication Years