High Sensitivity, High Reliability PINFET Receivers

Harsh Karande; Collin Fern; H. D. Law; K. Li; T. V. Muoi

doi:10.1117/12.968181

1 January 1987 High Sensitivity, High Reliability PINFET Receivers

Harsh Karande, Collin Fern, H. D. Law, K. Li, T. V. Muoi

Proceedings Volume 0842, Fiber Optics Reliability: Benign and Adverse Environments; (1987) https://doi.org/10.1117/12.968181
Event: Cambridge Symposium on Fiber Optics and Integrated Optoelectronics, 1987, Cambridge, MA, United States

Abstract

Extensive environmental tests followed by a high temperature, powered on life test have been performed on PINFET receivers manufactured at PCO, Inc. These receivers have completed over 6400 hours of powered on life test at 85 Degrees Celsius. Life time calculations cannot be performed since 63% failures have not occurred yet. This paper addresses initial failure modes of earlier construction devices, subsequent design and manufacturing improvements and the latest el ectro-optical, life and environmental performance of these high reliability PINFET receivers.

Citation Download Citation

Harsh Karande, Collin Fern, H. D. Law, K. Li, and T. V. Muoi "High Sensitivity, High Reliability PINFET Receivers", Proc. SPIE 0842, Fiber Optics Reliability: Benign and Adverse Environments, (1 January 1987); https://doi.org/10.1117/12.968181

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