Contrast analysis for DMD-based IR scene projector

Julia Rentz Dupuis; David J. Mansur; Samuel Grant; Scott P. Newbry

doi:10.1117/12.917686

10 May 2012 Contrast analysis for DMD-based IR scene projector

Julia Rentz Dupuis, David J. Mansur, Samuel Grant, Scott P. Newbry

Proceedings Volume 8356, Technologies for Synthetic Environments: Hardware-in-the-Loop XVII; 835603 (2012) https://doi.org/10.1117/12.917686
Event: SPIE Defense, Security, and Sensing, 2012, Baltimore, Maryland, United States

Abstract

OPTRA has developed a two-band midwave infrared (MWIR) scene projector based on digital micromirror device (DMD) technology; the projector is intended for training various IR tracking systems that exploit the relative intensities of two separate MWIR spectral bands. Next generation tracking systems have increasing dynamic range requirements which current DMD-based projector test equipment is not capable of meeting. While sufficient grayscale digitization can be achieved with current drive electronics, commensurate contrast is not currently available. It is towards this opportunity that OPTRA has initiated a dynamic range design improvement effort. In this paper we present our work towards the measurement and analysis of contrast limiting factors including substrate scattering, diffraction, and flat state emissivity. We summarize the results of an analytical model which indicates the largest contributions to background energy in the off state. We present the methodology and results from a series of breadboard tests designed to characterize these contributions. Finally, we suggest solutions to counter these contributions.

Citation Download Citation

Julia Rentz Dupuis, David J. Mansur, Samuel Grant, and Scott P. Newbry "Contrast analysis for DMD-based IR scene projector", Proc. SPIE 8356, Technologies for Synthetic Environments: Hardware-in-the-Loop XVII, 835603 (10 May 2012); https://doi.org/10.1117/12.917686

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