Paper
13 October 2011 eMET POC: realization of a proof-of-concept 50 keV electron multibeam mask exposure tool
Elmar Platzgummer, Christof Klein, Hans Loeschner
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Abstract
Based on a massively parallel beam writing strategy (BACUS 2010) a mask writer proof-of-concept tool was realized in 2011. The eMET (electron Mask Exposure Tool) POC column is designed to provide ca. 262-thousand (512 x 512) programmable beams of 50 keV energy and 20 nm or 10 nm beam size. The total beam current through the column is up to 1 μA. The eMET POC is equipped with a laser-interferometer controlled stage for exposure of one cm2 test pattern fields on 6" mask blanks. Operating the eMET POC with a stencil plate, first exposure results are presented. The further eMET POC project plan and the roadmap for eMET Alpha, Beta and multi-generational HVM tools are outlined.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Elmar Platzgummer, Christof Klein, and Hans Loeschner "eMET POC: realization of a proof-of-concept 50 keV electron multibeam mask exposure tool", Proc. SPIE 8166, Photomask Technology 2011, 816622 (13 October 2011); https://doi.org/10.1117/12.895523
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Cited by 10 scholarly publications and 21 patents.
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KEYWORDS
Photomasks

Logic

Silicon

Projection systems

Electronics

Line width roughness

Electrodes

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