Moire Strain Gauge With High Sensitivity

F. P. Chiang; C. L . Yuan; R. Krishnamurth

doi:10.1117/12.941715

17 February 1987 Moire Strain Gauge With High Sensitivity

F. P. Chiang, C. L . Yuan, R. Krishnamurth

Proceedings Volume 0814, Photomechanics and Speckle Metrology; (1987) https://doi.org/10.1117/12.941715
Event: 31st Annual Technical Symposium on Optical and Optoelectronic Applied Sciences and Engineering, 1987, San Diego, CA, United States

Abstract

A microcomputer based moire strain gauge with high sensitivity is developed which is capable of measuring strain automatically .

Citation Download Citation

F. P. Chiang, C. L . Yuan, and R. Krishnamurth "Moire Strain Gauge With High Sensitivity", Proc. SPIE 0814, Photomechanics and Speckle Metrology, (17 February 1987); https://doi.org/10.1117/12.941715

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