Field calibration of reflective imagery of targets and backgrounds

Van A. Hodgkin; Evelyn J. Boettcher; David D. Acton

doi:10.1117/12.851014

27 April 2010 Field calibration of reflective imagery of targets and backgrounds

Van A. Hodgkin, Evelyn J. Boettcher, David D. Acton

Proceedings Volume 7662, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXI; 76620Y (2010) https://doi.org/10.1117/12.851014
Event: SPIE Defense, Security, and Sensing, 2010, Orlando, Florida, United States

Abstract

This paper describes a simple but powerful method for calibrating the apparent broadband flux reflectance of target and background materials in short wave infrared (SWIR) imagery in the field, a method that can also be used in other reflective bands. The method is analogous to the approach of field calibration of thermal IR (infrared) imagery in which thermally regulated emissive references are positioned in a peripheral region of the sensor FOV to provide apparent temperature versus image grayscale. The principle difference between the emissive TIR approach and the reflective approach described here is that passive, well calibrated reflective references are used for the SWIR and do not require active emission of in-band radiation. This approach was recently used in a field collection using a high quality, well characterized broadband SWIR imager. Theory, analysis, and results are presented here.

Citation Download Citation

Van A. Hodgkin, Evelyn J. Boettcher, and David D. Acton "Field calibration of reflective imagery of targets and backgrounds", Proc. SPIE 7662, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXI, 76620Y (27 April 2010); https://doi.org/10.1117/12.851014

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