A white-light interferometry scheme to measure wide-wavelength dispersion of thermo-optic coefficients of optical switch materials

Se Min Kim; Seung Hwan Kim; Seoung Hun Lee; Yong Ku Kwon; Kyong Hon Kim; El-Hang Lee

doi:10.1117/12.842035

15 February 2010 A white-light interferometry scheme to measure wide-wavelength dispersion of thermo-optic coefficients of optical switch materials

Se Min Kim, Seung Hwan Kim, Seoung Hun Lee, Yong Ku Kwon, Kyong Hon Kim, El-Hang Lee

Author Affiliations +

Proceedings Volume 7605, Optoelectronic Integrated Circuits XII; 76050T (2010) https://doi.org/10.1117/12.842035
Event: SPIE OPTO, 2010, San Francisco, California, United States

Abstract

This paper reports demonstration of a new simple white-light interferometry method for continuous dispersion curves of the thermo-optic (TO) coefficients of optical samples. Phase shifts of the interference spectra of the white-light interferometer output are measured by changing temperature of an optical sample located in the one of the interferometer arms. A continuous dispersion curve of the TO coefficient of the sample materials over the full wavelength coverage region of the white light beam is obtained from the phase shift information with the temperature change. This new method is tested with a fused silica glass material of well-known optical properties to prove its accuracy by comparing the measured results with its known TO coefficient values. This continuous dispersion information of the TO coefficients of new optical materials will be useful for fabrication of the WDM signal processing devices or functional devices in multi-wavelengths.

Citation Download Citation

Se Min Kim, Seung Hwan Kim, Seoung Hun Lee, Yong Ku Kwon, Kyong Hon Kim, and El-Hang Lee "A white-light interferometry scheme to measure wide-wavelength dispersion of thermo-optic coefficients of optical switch materials", Proc. SPIE 7605, Optoelectronic Integrated Circuits XII, 76050T (15 February 2010); https://doi.org/10.1117/12.842035

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

;

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE