Junction temperature measurement on light-emitting diodes and its application

S. M. He; B. Zhang; N. Li; S. S. Liu; T. Zhang; W. Lu

doi:10.1117/12.845455

12 October 2009 Junction temperature measurement on light-emitting diodes and its application

S. M. He, B. Zhang, N. Li, S. S. Liu, T. Zhang, W. Lu

Proceedings Volume 7518, Photonics and Optoelectronics Meetings (POEM) 2009: Solar Cells, Solid State Lighting, and Information Display Technologies; 75180N (2009) https://doi.org/10.1117/12.845455
Event: Photonics and Optoelectronics Meetings 2009, 2009, Wuhan, China

Abstract

Recently, the GaN based LED white light illumination technology has been developed rapidly. It is required to measure the p-n junction temperature of LED which has been encapsulated in the lamp with the temperature measurement error less than 1K. We present a spectroscopy approach to measure this p-n junction temperature of LED encapsulated in the lamp. The electroluminescence peak shift is used to determine the temperature difference between the junction and the ambient. At ambient temperature of 300K, the junction temperature can be determined by the formula of T=300+27.8▵λ_p-1.22▵λ_p ² with the unit of temperature T in K and electroluminescence peak shift ▵λ_p in nm. This method has been used on the high power lamp made by LED. The LED lamp has been fabricated for the illuminated application on the satellite and the spacecraft in China.

Citation Download Citation

S. M. He, B. Zhang, N. Li, S. S. Liu, T. Zhang, and W. Lu "Junction temperature measurement on light-emitting diodes and its application", Proc. SPIE 7518, Photonics and Optoelectronics Meetings (POEM) 2009: Solar Cells, Solid State Lighting, and Information Display Technologies, 75180N (12 October 2009); https://doi.org/10.1117/12.845455

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