Automatic inspection of textured surfaces by support vector machines

Sina Jahanbin; Alan C. Bovik; Eduardo Pérez; Dinesh Nair

doi:10.1117/12.825194

10 September 2009 Automatic inspection of textured surfaces by support vector machines

Sina Jahanbin, Alan C. Bovik, Eduardo Pérez, Dinesh Nair

Proceedings Volume 7432, Optical Inspection and Metrology for Non-Optics Industries; 74320A (2009) https://doi.org/10.1117/12.825194
Event: SPIE Optical Engineering + Applications, 2009, San Diego, California, United States

Abstract

Automatic inspection of manufactured products with natural looking textures is a challenging task. Products such as tiles, textile, leather, and lumber project image textures that cannot be modeled as periodic or otherwise regular; therefore, a stochastic modeling of local intensity distribution is required. An inspection system to replace human inspectors should be flexible in detecting flaws such as scratches, cracks, and stains occurring in various shapes and sizes that have never been seen before. A computer vision algorithm is proposed in this paper that extracts local statistical features from grey-level texture images decomposed with wavelet frames into subbands of various orientations and scales. The local features extracted are second order statistics derived from grey-level co-occurrence matrices. Subsequently, a support vector machine (SVM) classifier is trained to learn a general description of normal texture from defect-free samples. This algorithm is implemented in LabVIEW and is capable of processing natural texture images in real-time.

Citation Download Citation

Sina Jahanbin, Alan C. Bovik, Eduardo Pérez, and Dinesh Nair "Automatic inspection of textured surfaces by support vector machines", Proc. SPIE 7432, Optical Inspection and Metrology for Non-Optics Industries, 74320A (10 September 2009); https://doi.org/10.1117/12.825194

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