The geometry effect on threshold voltage of top-contact and bottom contact pentacene based thin film transistors

Yu-Wu Wang; De-Zhi Liu; Ming-Yue Hong; Horng-Long Cheng

doi:10.1117/12.826072

20 August 2009 The geometry effect on threshold voltage of top-contact and bottom contact pentacene based thin film transistors

Yu-Wu Wang, De-Zhi Liu, Ming-Yue Hong, Horng-Long Cheng

Author Affiliations +

Proceedings Volume 7417, Organic Field-Effect Transistors VIII; 74171F (2009) https://doi.org/10.1117/12.826072
Event: SPIE Photonic Devices + Applications, 2009, San Diego, California, United States

Abstract

In this article, we fabricated a series of different geometries for pentacene based thin film transistors (TFTs), including top contact (TC) and bottom contact (BC) configurations, to monitor variations in characteristics. The threshold voltage (Vth) in the saturation regime shifted toward a positive voltage, i.e., from 0.5, 3.2, 9.1, 12.1, and 19.5 V for the channel lengths 67, 47, 23, 19, and 15 μm, respectively, in BC TFTs. All of the TFTs were operated in depletion mode. However, the Vth in the linear regime shifted from -9.3, -9.0, -3.8, -1.8, and 1.5 V for the same devices. Most of the TFTs in the linear regime were operated in enhanced mode. The phenomenon is believed to be strongly correlated with the longitudinal electric field (VDS/L). The high VDS induces a high carrier injection, which makes the pentacene TFTs behave like a depletion type transistor. This assumption is evidenced by the low carrier injection with small VDS results. The device configuration and space charge region must be discussed in more detail. Furthermore, the field effect mobility variation and structure configuration effect is discussed in more detail within the full manuscript.

Citation Download Citation

Yu-Wu Wang, De-Zhi Liu, Ming-Yue Hong, and Horng-Long Cheng "The geometry effect on threshold voltage of top-contact and bottom contact pentacene based thin film transistors", Proc. SPIE 7417, Organic Field-Effect Transistors VIII, 74171F (20 August 2009); https://doi.org/10.1117/12.826072

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