Next-generation PIR security sensors: concept testing and evaluation

Kevin C. Liddiard

doi:10.1117/12.818422

6 May 2009 Next-generation PIR security sensors: concept testing and evaluation

Kevin C. Liddiard

Proceedings Volume 7298, Infrared Technology and Applications XXXV; 72980X (2009) https://doi.org/10.1117/12.818422
Event: SPIE Defense, Security, and Sensing, 2009, Orlando, Florida, United States

Abstract

In previous presentations to this SPIE forum a new technology was outlined aimed at replacing pyroelectric sensors with resistance microbolometer MOEMS-based sensors capable of vastly superior performance. The technology can be implemented as either a PCB replacement to current sensors, giving extended detection range and ability to sense slow temperature change, or a 'smart' sensor with further performance enhancements and imaging capability. This paper reports the results of new laboratory and field tests of a laboratory prototype sensor and extrapolates these results to performance of production sensors. In particular, results are presented for NETD, detection range for human targets and detection of simulated electrical faults and developing fires. Previous results were reported for FPA operated without evacuation and using a low cost plastic Fresnel lens. However with wafer level packaging now becoming widely available in MEMS and CMOS foundries, much high performance can be achieved, opening up many additional applications. Performance of new FPAs designed for vacuum packaging is highlighted.

Citation Download Citation

Kevin C. Liddiard "Next-generation PIR security sensors: concept testing and evaluation", Proc. SPIE 7298, Infrared Technology and Applications XXXV, 72980X (6 May 2009); https://doi.org/10.1117/12.818422

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