Volumetric calibration of multi-axis machine tools through parametric way

Abdul Wahid Khan; Wuyi Chen

doi:10.1117/12.807079

2 February 2009 Volumetric calibration of multi-axis machine tools through parametric way

Abdul Wahid Khan, Wuyi Chen

Proceedings Volume 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications; 71602Q (2009) https://doi.org/10.1117/12.807079
Event: International Conference of Optical Instrument and Technology, 2008, Beijing, China

Abstract

A methodology was implemented to evolve the volumetric errors of multiaxis machine tools through a parametric way. The volumetric error was calibrated and evaluated in the workspace arbitrarily by implementing parametric methods and techniques. In parametric method linear displacement errors and angular displacement errors were measured through a laser interferometer with combination of a newly developed three-line measuring method to measure the prismatic joints for efficient and quick error meterage. Besides these, squareness errors between the axes were also quantified by using reversal method. Volumetric accuracy portrayed the real error picture between the workpiece and cutting tool or end effectors or a measuring probe. So positional errors, straightness errors, angular errors and squareness errors were quantified and transformed into volumetric accuracy by using generalized homogenous transformation matrices, whereas forward kinematics technique was used as a tool. Measured results can be used to compensate the volumetric errors to achieve high precision in manufacturing and measurement through physical compensation, making correction, adjustment or improvement through software. Reported here is the volumetric accuracy results carried on a multi-axis CNC milling machine under controlled environmental conditions and as per the standard procedure and practice.

Citation Download Citation

Abdul Wahid Khan and Wuyi Chen "Volumetric calibration of multi-axis machine tools through parametric way", Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71602Q (2 February 2009); https://doi.org/10.1117/12.807079

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available