Paper
19 March 2009 SMART reliability mechanism for very large storage systems
Author Affiliations +
Proceedings Volume 7125, Eighth International Symposium on Optical Storage and 2008 International Workshop on Information Data Storage; 712517 (2009) https://doi.org/10.1117/12.822647
Event: Eighth International Symposium on Optical Storage and 2008 International Workshop on Information Data Storage, 2008, Wuhan, China
Abstract
In this paper, we investigate the reliability in a petabyte scale storage system built from thousands of Object-Based Storage Devices and study the mechanisms to protect data loss when disk failure happens. We delve in two underlying redundancy mechanisms: 2-way mirroring, 3-way mirroring. To accelerate data reconstruction, Fast Mirroring Copy is employed where the reconstructed objects are stored on different OBSDs throughout the system. A SMART reliability for enhancing the reliability in very large-scale storage system is proposed. Results show that our SMART Reliability Mechanism can utilize the spare resources (including processing, network, and storage resources) to improve the reliability in very large storage systems.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dongjian Luo, Haifeng Zhong, Canhao Pei, Wei Wu, and Chengfeng Zhang "SMART reliability mechanism for very large storage systems", Proc. SPIE 7125, Eighth International Symposium on Optical Storage and 2008 International Workshop on Information Data Storage, 712517 (19 March 2009); https://doi.org/10.1117/12.822647
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KEYWORDS
Reliability

Data storage

Mirrors

Failure analysis

Computing systems

Data processing

Data backup

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