Snapshot imaging spectropolarimetry in the visible and infrared

Riley W. Aumiller; Corrie Vanderlugt; Eustace L. Dereniak; Robert Sampson; Robert W. McMillan

doi:10.1117/12.784793

31 March 2008 Snapshot imaging spectropolarimetry in the visible and infrared

Riley W. Aumiller, Corrie Vanderlugt, Eustace L. Dereniak, Robert Sampson, Robert W. McMillan

Author Affiliations +

Proceedings Volume 6972, Polarization: Measurement, Analysis, and Remote Sensing VIII; 69720D (2008) https://doi.org/10.1117/12.784793
Event: SPIE Defense and Security Symposium, 2008, Orlando, Florida, United States

Abstract

Two imaging systems have been designed and built to function as snapshot imaging spectropolarimeters; one system made to operate in the visible part of the spectrum, the other for the long wavelength infrared, 8 to 12 microns. The devices are based on computed tomographic imaging channeled spectropolarimetry (CTICS), a unique technology that allows both the spectra and the polarization state for all of the wavelength bands in the spectra to be simultaneously recorded from every spatial position in an image with a single integration period of the imaging system. The devices contain no moving parts and require no scanning, allowing them to acquire data without the artifacts normally associated with scanning spectropolarimeters. Details of the two imaging systems will be presented.

Citation Download Citation

Riley W. Aumiller, Corrie Vanderlugt, Eustace L. Dereniak, Robert Sampson, and Robert W. McMillan "Snapshot imaging spectropolarimetry in the visible and infrared", Proc. SPIE 6972, Polarization: Measurement, Analysis, and Remote Sensing VIII, 69720D (31 March 2008); https://doi.org/10.1117/12.784793

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