Paper
28 December 2007 Thick-film gold and platinum conducing paths for high temperature electronics
Małgorzata Jakubowska, Jerzy Kalenik, Konrad Kiełbasiński, Anna Młożniak, Elżbieta Zwierkowska
Author Affiliations +
Proceedings Volume 6937, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2007; 69371S (2007) https://doi.org/10.1117/12.784703
Event: Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2007, 2007, Wilga, Poland
Abstract
A new thick film gold conductive composition for high temperature electronics was elaborated and tested. This paste was designed for metallization of the alumina substrates (Al2O3) for electrical interconnection system, e.g. for a silicon carbide Schotky diode. Also platinum pastes for conductive paths resistant to high temperatures (over 600°C) were elaborated by the authors. Several gold and platinum powders and glasses, as well as bonding oxides were examined to design a suitable composition. The influence of the paste composition and firing temperature on the layer properties was shown. The obtained layers were aged a 1000 hours at elevated temperatures (350°C). Sheet resistance of platinum and gold paths was measured. Mechanical strength and electrical resistance of wire bonds to the gold layers after aging were also examined. The electrical measurements were performed at room temperature and elevated temperature (150°C, 250°C, 350°C), using precise four-wire method. The microstructure of layers was also shown.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Małgorzata Jakubowska, Jerzy Kalenik, Konrad Kiełbasiński, Anna Młożniak, and Elżbieta Zwierkowska "Thick-film gold and platinum conducing paths for high temperature electronics", Proc. SPIE 6937, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2007, 69371S (28 December 2007); https://doi.org/10.1117/12.784703
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KEYWORDS
Gold

Platinum

Resistance

Glasses

Photography

Scanning electron microscopy

Electronics

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