Fast focus field calculations

Marcel Leutenegger; Matthias Geissbuehler; Iwan Märki; Rainer A. Leitgeb; Theo Lasser

doi:10.1117/12.763188

20 February 2008 Fast focus field calculations

Marcel Leutenegger, Matthias Geissbuehler, Iwan Märki, Rainer A. Leitgeb, Theo Lasser

Proceedings Volume 6861, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XV; 68610R (2008) https://doi.org/10.1117/12.763188
Event: SPIE BiOS, 2008, San Jose, California, United States

Abstract

We present a method for fast calculation of the electromagnetic field near the focus of an objective with a high numerical aperture (NA). Instead of direct integration, the vectorial Debye diffraction integral is evaluated with the fast Fourier transform for calculating the electromagnetic field in the entire focal region. We generalize this concept with the chirp z transform for obtaining a flexible sampling grid and an additional gain in computation speed. Under the conditions for the validity of the Debye integral representation, our method yields the amplitude, phase and polarization of the focus field for an arbitrary paraxial input field in the aperture of the objective. Our fast calculation method is particularly useful for engineering the point-spread function or for fast image deconvolution. We present several case studies by calculating the focus fields of high NA oil immersion objectives for various amplitude, polarization and phase distributions of the input field. In addition, the calculation of an extended polychromatic focus field generated by a Bessel beam is presented. This extended focus field is of particular interest for Fourier domain optical coherence tomography because it preserves a lateral resolution of a few micrometers over an axial distance in the millimeter range.

Citation Download Citation

Marcel Leutenegger, Matthias Geissbuehler, Iwan Märki, Rainer A. Leitgeb, and Theo Lasser "Fast focus field calculations", Proc. SPIE 6861, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XV, 68610R (20 February 2008); https://doi.org/10.1117/12.763188

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