Form-birefringence simulation: different approaches comparison

Andrey A. Lutich

doi:10.1117/12.752474

31 July 2007 Form-birefringence simulation: different approaches comparison

Andrey A. Lutich

Author Affiliations +

Proceedings Volume 6728, ICONO 2007: Novel Photonics Materials; Optics and Optical Diagnostics of Nanostructures; 67283H (2007) https://doi.org/10.1117/12.752474
Event: The International Conference on Coherent and Nonlinear Optics, 2007, Minsk, Belarus

Abstract

In this paper we compare different effective medium approximations that are widely used for refractive index and birefringence simulation in 2d nanostructures with plane-wave expansion approach which is considered and proved to be absolutely correct. It is estimated independence of the result of extraordinary refractive index (for TM-polarization) simulation on the method. Calculations carried out for model porous alumina film demonstrate the best agreement between results of plane-wave expansion method and Maxwell-Garnett theory. For Bruggeman approximation and Boundary conditions model applicability regions have been clarified at the porosity scale.

Citation Download Citation

Andrey A. Lutich "Form-birefringence simulation: different approaches comparison", Proc. SPIE 6728, ICONO 2007: Novel Photonics Materials; Optics and Optical Diagnostics of Nanostructures, 67283H (31 July 2007); https://doi.org/10.1117/12.752474

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