Paper
13 September 2007 A polarization modulator for the far infrared (terhahertz waves)
Theodore C. Oakberg, Tsuyoshi Akiyama, Kazuya Nakayama
Author Affiliations +
Abstract
Photoelastic modulator (PEM) based polarimeters have been used for plasma diagnostics of magnetically confined fusion devices for over 15 years. With the invention of a new laser operating at 47.7 and 57.2 microns, using this radiation for plasma diagnostics has become possible, providing that PEMs can be made for these wavelengths of radiation. Recently, a PEM has been made which meets these requirements. The device uses a silicon optical element with a single-layer polymer anti-reflective coating. Design decisions during the development and performance characteristics of the new PEM will be discussed. Topics include the choice of silicon as an optical element material, antireflective coating design and material choice, optical transmission, maximum retardation, useful aperture and modulation frequency.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Theodore C. Oakberg, Tsuyoshi Akiyama, and Kazuya Nakayama "A polarization modulator for the far infrared (terhahertz waves)", Proc. SPIE 6682, Polarization Science and Remote Sensing III, 66820X (13 September 2007); https://doi.org/10.1117/12.731827
Lens.org Logo
CITATIONS
Cited by 3 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Silicon

Optical components

Antireflective coatings

Coating

Refractive index

Absorption

Far infrared

Back to Top