Paper
18 June 2007 Robust Shack-Hartmann wavefront sensing with ultraflat microaxicons
Author Affiliations +
Abstract
Recently developed Shack-Hartmann sensors with axicon beam shapers show an enhanced robustness compared to setups with spherical microlenses. With ultraflat axicon arrays, further improvements were obtained. Very extended, fringeless nondiffracting beams or "needle beams" with self-reconstructing properties can be produced. Specific advantages of thin-film structures like low dispersion and reflective operation can be implemented. Here we report on first systematic studies of angular tolerance and displacement sensitivity of different types of refractive, reflective and diffractive Shack-Hartmann devices. A quantitative description of the functionality is given on the basis of higher order spatial statistical moments. This method enables for identifying optimum parameter ranges to determine wavefront curvatures under extreme conditions.
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R. Grunwald, M. Bock, and S. Huferath "Robust Shack-Hartmann wavefront sensing with ultraflat microaxicons", Proc. SPIE 6617, Modeling Aspects in Optical Metrology, 66170O (18 June 2007); https://doi.org/10.1117/12.726081
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KEYWORDS
Axicons

Wavefront sensors

Wavefronts

Thin films

Beam shaping

Reflectivity

Statistical analysis

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